|
Volumn 520, Issue 2, 2011, Pages 778-783
|
Perovskite oxynitride LaTiOxNy thin films: Dielectric characterization in low and high frequencies
|
Author keywords
Dielectric properties; Oxynitride; Perovskite; Thin film
|
Indexed keywords
CONDUCTIVE FILMS;
DIELECTRIC PROPERTIES;
DIELECTRIC PROPERTIES OF SOLIDS;
ELECTRIC FIELDS;
LANTHANUM COMPOUNDS;
MAGNESIA;
MAGNETRON SPUTTERING;
NIOBIUM COMPOUNDS;
NITRIDES;
PEROVSKITE;
PEROVSKITE SOLAR CELLS;
SINGLE CRYSTALS;
SUBSTRATES;
CRYSTALLINE QUALITY;
DIELECTRIC CHARACTERIZATION;
DIFFERENT SUBSTRATES;
HIGH DIELECTRIC CONSTANTS;
LOW AND HIGH FREQUENCIES;
OXYNITRIDES;
POLYCRYSTALLINE FILM;
RADIO FREQUENCY MAGNETRON SPUTTERING;
THIN FILMS;
|
EID: 80755136542
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.01.226 Document Type: Conference Paper |
Times cited : (11)
|
References (18)
|