Characterization of the Structural, Optical, and Dielectric Properties of Oxynitride Perovskites AMO2N (A = Ba, Sr, Ca; M = Ta, Nb)

Chemistry of Materials

Volumn 16, Issue 7, 2004, Pages 1267-1276

  Kim, Young Il ^a   Woodward, Patrick M ^a   Baba Kishi, Karim Z ^b   Tai, Cheuk W ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; PERMITTIVITY; PHASE TRANSITIONS; SINTERING; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

IMPEDANCE SPECTROSCOPY; OPTICAL BAND GAPS;

PEROVSKITE;

BARIUM; CALCIUM; NIOBIUM; PEROVSKITE; STRONTIUM; TANTALUM;

ARTICLE; CRYSTAL STRUCTURE; DIELECTRIC CONSTANT; ELECTRIC CONDUCTIVITY; ELECTRICAL PARAMETERS; ELECTRON DIFFRACTION; IMPEDANCE; PHASE TRANSITION; POLARIMETRY; REDUCTION; REFLECTOMETRY; ROOM TEMPERATURE; STRUCTURE ANALYSIS; SYNTHESIS; X RAY POWDER DIFFRACTION;

EID: 1842679270     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm034756j     Document Type: Article

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