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Volumn 115, Issue 44, 2011, Pages 21804-21812

Ellipsometry as a real-time optical tool for monitoring and understanding graphene growth on metals

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRIC METHOD; GRAPHENE GROWTH; IN-LINE; IN-SITU; KINETIC ELLIPSOMETRY; NONDESTRUCTIVE METHODS; OPTICAL TOOLS; REAL TIME MONITORING;

EID: 80455174427     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp2068914     Document Type: Article
Times cited : (39)

References (32)
  • 23
    • 0005881972 scopus 로고
    • Bamford, C. H. Tipper, C. F. H. Compton, R. G. Elsevier: Amsterdam, The Netherlands, Vol
    • Koga, Y.; Harrison, L. G. In Comprehensive Chemical Kinetics; Bamford, C. H.; Tipper, C. F. H.; Compton, R. G., Eds.; Elsevier: Amsterdam, The Netherlands, 1984; Vol. 21, p 120.
    • (1984) Comprehensive Chemical Kinetics , vol.21 , pp. 120
    • Koga, Y.1    Harrison, L.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.