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Volumn 406, Issue 24, 2011, Pages 4578-4583
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Correlation between electrical and optical properties of Cr:ZnO thin films grown by pulsed laser deposition
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Author keywords
PL; PLD; Thin film; ZnO
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Indexed keywords
BAND GAP NARROWING;
BLUE SHIFT;
C-AXIS ORIENTATIONS;
COMPETING EFFECTS;
CR CONCENTRATION;
CR-DOPING;
DOPED ZNO;
ELECTRICAL AND OPTICAL PROPERTIES;
FREE CARRIER CONCENTRATION;
INTERSTITIALS;
MINIMUM VALUE;
PL;
SAPPHIRE SUBSTRATES;
VALENCE STATE;
ZNO;
CHROMIUM;
CONCENTRATION (PROCESS);
CONDUCTIVE FILMS;
DEPOSITION;
ELECTRIC PROPERTIES;
ENERGY GAP;
METALLIC FILMS;
OPTICAL CORRELATION;
OPTICAL FILMS;
OPTICAL PROPERTIES;
PHOTOELECTRON SPECTROSCOPY;
POINT DEFECTS;
PULSED LASER DEPOSITION;
PULSED LASERS;
SEMICONDUCTOR DOPING;
THIN FILMS;
VAPOR DEPOSITION;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC OXIDE;
CARRIER CONCENTRATION;
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EID: 80054998389
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2011.09.024 Document Type: Article |
Times cited : (34)
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References (35)
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