Recognizing and avoiding artifacts in atomic force microscopy imaging

Methods in Molecular Biology

Volumn 736, Issue , 2011, Pages 31-43

  Canale, Claudio ^a   Torre, Bruno ^a   Ricci, Davide ^a,b   Braga, Pier Carlo ^c  

^a ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

^b UNIVERSITY OF GENOA   (Italy)

^c UNIVERSITY OF MILAN   (Italy)

Author keywords

AFM; Creep; Instability; Nonlinearity; Tip artifacts

Indexed keywords

ARTIFACT; ATOMIC FORCE MICROSCOPY; IMAGE PROCESSING; NONLINEAR SYSTEM; SOFTWARE; TOPOGRAPHY; ARTICLE; COMPUTER PROGRAM; METHODOLOGY; SURFACE PROPERTY;

ARTIFACTS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ATOMIC FORCE; SOFTWARE; SURFACE PROPERTIES;

EID: 80054842999     PISSN: 10643745     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-1-61779-105-5_3     Document Type: Chapter

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