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Volumn 63, Issue 2, 1996, Pages 115-124

Artefacts in non-contact mode force microscopy: The role of adsorbed moisture

Author keywords

Adsorbed moisture; Artefacts; Force microscopy; Non contact mode

Indexed keywords

CALCULATIONS; IMAGE ANALYSIS; MATHEMATICAL MODELS; MOISTURE; POLYSTYRENES; SURFACE STRUCTURE; SURFACES;

EID: 0030175083     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00023-X     Document Type: Article
Times cited : (11)

References (13)
  • 7
    • 0003478015 scopus 로고
    • November 27-29, Newcastle, NSW, in press
    • t can be used to directly image a standard tip, and thus infer the two parameters; i.e., G.S. Watson, Proc. NTA/VSA '95 (1995) November 27-29, Newcastle, NSW, in press.
    • (1995) Proc. NTA/VSA '95
    • Watson, G.S.1
  • 11
    • 4243507145 scopus 로고
    • submitted
    • [11] The implications of these observations have been explored; the results will be described elsewhere, J.F. Dobson and B.P. Dinte, Phys. Rev. B (1995), submitted.
    • (1995) Phys. Rev. B
    • Dobson, J.F.1    Dinte, B.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.