Local current-voltage behaviors of preferentially and randomly textured Cu(In,Ga)Se2 thin films investigated by conductive atomic force microscopy

Applied Physics A: Materials Science and Processing

Volumn 104, Issue 4, 2011, Pages 1189-1194

  Shin, R H ^a   Jo, W ^a   Kim, D W ^a   Yun, Jae Ho ^b   Ahn, S ^b  

^a Ewha Womans University   (South Korea)

^b Korea Institute of Energy Research (KIER)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CONDUCTION; CIGS THIN FILMS; CONDUCTION PATHS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CU(IN , GA)SE; CURRENT VOLTAGE; CURRENT-VOLTAGE MEASUREMENTS; ELECTRICAL TRANSPORT PROPERTIES; EXTERNAL VOLTAGE BIAS; GLASS SUBSTRATES; POLYCRYSTALLINE; RANDOM TEXTURES;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; GALLIUM; GRAIN BOUNDARIES; GRAIN GROWTH; MOLYBDENUM; SEMICONDUCTING SELENIUM COMPOUNDS; SUBSTRATES; THIN FILMS; TRANSPORT PROPERTIES;

CONDUCTIVE FILMS;

EID: 80053908354     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-011-6408-y     Document Type: Article

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