Contact formation and recombination at screen-printed local aluminum-alloyed silicon solar cell base contacts

IEEE Transactions on Electron Devices

Volumn 58, Issue 10, 2011, Pages 3239-3245

  Müller, Jens ^a   Bothe, Karsten ^a   Gatz, Sebastian ^a   Plagwitz, Heiko ^b   Schubert, Gunnar ^a   Brendel, Rolf ^b  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

^b Sunways AG   (Germany)

Author keywords

Carrier lifetime; laser ablation; local back surface field (LBSF); silicon solar cells

Indexed keywords

BACK SURFACE FIELDS; CONTACT FORMATION; CONTACT GEOMETRY; CONTACT SIZE; DIELECTRIC STACK; LAYER THICKNESS; LIFETIME MAPPING; LIFETIME MEASUREMENTS; LINE CONTACT; P-TYPE; P-TYPE FLOAT-ZONE SILICON; REVERSE-SATURATION CURRENTS; SCANNING ELECTRON MICROSCOPY IMAGE; SCREEN-PRINTED;

ABLATION; CARRIER LIFETIME; INFRARED LASERS; LASER ABLATION; LASER APPLICATIONS; SCANNING ELECTRON MICROSCOPY; SILICON SOLAR CELLS;

ALUMINUM;

EID: 80053183937     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2011.2161089     Document Type: Article

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