Combining real and reciprocal space information for aberration free coherent electron diffractive imaging

Ultramicroscopy

Volumn 111, Issue 7, 2011, Pages 817-823

  Zuo, Jian Min ^a   Zhang, Jiong ^a   Huang, Weijie ^a   Ran, Ke ^a   Jiang, Bin ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Aberration correction; Diffraction imaging; Electron diffraction; Imaging resolution; Inversion

Indexed keywords

ABERRATION CORRECTION; COMPUTATION TECHNIQUES; DIFFRACTION IMAGING; DIFFRACTION PLANES; DIFFRACTIVE IMAGING; IMAGING RESOLUTION; INVERSION; ITERATIVE TRANSFORMATION; RECIPROCAL SPACE; RESIDUAL ABERRATION; RESOLUTION LIMITS; TRANSMISSION ELECTRON MICROSCOPE;

CARBON NANOTUBES; IMAGE RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY; WAVE FUNCTIONS;

ELECTRON DIFFRACTION;

ALGORITHM; ARTICLE; COMPLEX FORMATION; ELECTRON DIFFRACTION; ELECTRON DIFFRACTIVE IMAGING; EXPERIMENTAL STUDY; IMAGE PROCESSING; IMAGING; LIGHT INTENSITY; MATHEMATICAL COMPUTING; OPTICAL RESOLUTION; PROCESS DEVELOPMENT; WAVEFORM;

ALGORITHMS; ELECTRONS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, MOLECULAR; NANOTUBES, CARBON; QUANTUM DOTS; X-RAY DIFFRACTION;

EID: 80053051455     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.10.013     Document Type: Article

References (27)

1. Weierstall U., Spence J.C.H., Stevens M., Downing K.H. Micron 1999, 30:335.
2. Spence J.C.H., Calef B., Zuo J.M. Acta Crystallographica Section A 1999, 55:112.
3. Weierstall U., Chen Q., Spence J.C.H., Howells M.R., Isaacson M., Panepucci R.R. Ultramicroscopy 2002, 90:171.
4. Spence J.C.H., Howells M., Marks L.D., Miao J. Ultramicroscopy 2001, 90:1.
5. Kisielowski C., Freitag B., Bischoff M., van Lin H., Lazar S., Knippels G., Tiemeijer P., van der Stam M., von Harrach S., Stekelenburg M., Haider M., Uhlemann S., Muller H., Hartel P., Kabius B., Miller D., Petrov I., Olson E.A., Donchev T., Kenik E.A., Lupini A.R., Bentley J., Pennycook S.J., Anderson I.M., Minor A.M., Schmid A.K., Duden T., Radmilovic V., Ramasse Q.M., Watanabe M., Erni R., Stach E.A., Denes P., Dahmen U. Microscopy and Microanalysis 2008, 14:469.
6. Gerchberg R.W., Saxton W.O. Optik 1972, 35:237.
7. Fienup J.R. Applied Optics 1982, 21:2758.
8. Elser V. Journal of the Optical Society of America A-Optics Image Science and Vision 2003, 20:40.
9. Ishizuka K., Miyazaki M., Uyeda N. Acta Crystallographica Section A 1982, 38:408.
10. Hu J.J., Li F.H., Fan H.F. Ultramicroscopy 1992, 41:387.
11. Levi A., Stark H. Journal of the Optical Society of America A-Optics Image Science and Vision 1984, 1:932.
12. Huang W.J., Zuo J.M., Jiang B., Kwon K.W., Shim M. Nature Physics 2009, 5:129.
13. Zuo J.M., Gao M., Tao J., Li B.Q., Twesten R., Petrov I. Microscopy Research and Technique 2004, 64:347.
14. Yamasaki J., Sawada H., Tanaka N. Journal of Electron Microscopy 2005, 54:123.
15. Morishita S., Yamasaki J., Nakamura K., Kato T., Tanaka N. Applied Physics Letters 2008, 93.
16. Sayre D., Chapman H.N., Miao J. Acta Crystallographica Section A 1998, 54:232.
17. Miao J.W., Charalambous P., Kirz J., Sayre D. Nature 1999, 400:342.
18. Bates R.H.T. Optik 1982, 61:247.
19. Wu J.S., Weierstall U., Spence J.C.H., Koch C.T. Optics Letters 2004, 29:2737.
20. Huang W.J., Jiang B., Sun R.S., Zuo J.M. Ultramicroscopy 2007, 107:1159.
21. Millane R.P., Stroud W.J. Journal of the Optical Society of America A-Optics Image Science and Vision 1997, 14:568.
22. Fienup J.R. Journal of the Optical Society of America 1987, 6:118.
23. Marchesini S., He H., Chapman H.N., Hau-Riege S.P., Noy A., Howells M.R., Weierstall U., Spence J.C.H. Physical Review B 2003, 68.
24. Wu J.S., Spence J.C.H. Acta Crystallographica Section A 2005, 61:194.
25. Gonzalez R.C., Woods R.E., Eddins S.L. Digital Image Processing 2002, Prentice Hall. 2nd ed.
26. Zuo J.M., Vartanyants I., Gao M., Zhang R., Nagahara L.A. Science 2003, 300:1419.
27. Nellist P.D., Chisholm M.F., Dellby N., Krivanek O.L., Murfitt M.F., Szilagyi Z.S., Lupini A.R., Borisevich A., Sides W.H., Pennycook S.J. Science 2004, 305:1741.