Wavelet-based defect detection in solar wafer images with inhomogeneous texture

Pattern Recognition

Volumn 45, Issue 2, 2012, Pages 742-756

  Li, Wei Chen ^a   Tsai, Du Ming ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Defect detection; inhomogeneous texture; Solar wafer; Surface inspection; Wavelet transform

Indexed keywords

ALTERNATIVE SOURCE; BLURRED EDGES; COEFFICIENT VALUES; CRYSTAL GRAINS; DECOMPOSITION LEVEL; DEFECT DETECTION; DEFECT INSPECTION; LOCAL DEFECTS; MANUFACTURING COST; MARKET SHARE; MULTICRYSTALLINE; MULTICRYSTALLINE SOLAR CELLS; RANDOM POSITION; RESOLUTION LEVEL; SENSED IMAGE; SHARP EDGES; SOLAR WAFER; SURFACE INSPECTION; TEXTURE ANALYSIS; WAFER IMAGES; WAFER SURFACE; WAVELET COEFFICIENTS;

COMPETITION; CONVERSION EFFICIENCY; INSPECTION; SOLAR ENERGY; SURFACES; TEXTURES; WAVELET DECOMPOSITION; WAVELET TRANSFORMS;

SURFACE DEFECTS;

EID: 80052962655     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2011.07.025     Document Type: Article

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