An anisotropic diffusion-based defect detection for low-contrast glass substrates

Image and Vision Computing

Volumn 26, Issue 2, 2008, Pages 187-200

  Chao, Shin Min ^a   Tsai, Du Ming ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Anisotropic diffusion; Defect detection; Glass substrates; Low contrast images; Surface inspection

Indexed keywords

DEFECTS; GLASS; IMAGE ACQUISITION; IMAGING TECHNIQUES; LIQUID CRYSTAL DISPLAYS; SUBSTRATES; THIN FILM TRANSISTORS;

ANISOTROPIC DIFFUSION; GLASS SUBSTRATES; LOW-CONTRAST IMAGES; SURFACE INSPECTION;

DIFFUSION IN SOLIDS;

EID: 35848963861     PISSN: 02628856     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.imavis.2007.03.003     Document Type: Article

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