A new approach for explanation of specimen rupture under high electric field

Ultramicroscopy

Volumn 109, Issue 5, 2009, Pages 480-485

  Mikhailovskij, I M ^a   Wanderka, N ^b   Storizhko, V E ^c   Ksenofontov, V A ^a   Mazilova, T I ^a  

^a INSTITUTE OF HYDROBIOLOGY   (Ukraine)

^b HAHN MEITNER INSTITUT   (Germany)

^c INSTITUTE OF APPLIED PHYSICS   (Ukraine)

Author keywords

Electric field; Field ion microscopy; Plasma; Space charge

Indexed keywords

CAPACITOR PLATES; CATHODE PLASMAS; CONSTANT VOLTAGES; ELECTRICAL BREAKDOWNS; EXPANDING PLASMAS; EXPERIMENTAL DATUM; FIELD STRENGTHS; FIELD-ION MICROSCOPY; HIGH ELECTRIC FIELDS; HIGH VELOCITIES; IN FIELDS; NEW APPROACHES; POSITIVE FIELDS; SAMPLE FAILURES; SPACE CHARGE; VACUUM BREAKDOWNS;

CAPACITANCE; CAPACITORS; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; ION MICROSCOPES; IONS; PLASMAS;

ELECTRIC DISCHARGES;

NANOPARTICLE;

ARTICLE; CATHODE; DESTRUCTION; ELECTRIC FIELD; ELECTRODE; ELECTRON MICROSCOPY; FIELD ION MICROSCOPY; IONIZATION; MECHANICAL STRESS;

EID: 62549136974     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.12.003     Document Type: Article

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