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Volumn 49, Issue 20, 2011, Pages 6199-6226

Optimising the location of crossovers in conveyor-based automated material handling systems in semiconductor wafer fabs

Author keywords

AMHS; analytical models; conveyors; crossovers; facility design; heuristics; wafer fabrication

Indexed keywords

AMHS; ANALYTICAL MODEL; CROSSOVERS; FACILITY DESIGN; HEURISTICS; WAFER FABRICATIONS;

EID: 80052181858     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207543.2010.528059     Document Type: Article
Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.