Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging

Journal of Microscopy

Volumn 193, Issue 1, 1999, Pages 15-19

  Feja, B ^a   Aebi, U ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

Cryo electron microscopy; EFTEM; Energy filtering; Inelastic mean free path; Thickness measurements

Indexed keywords

CCD CAMERAS; ELECTRON MICROSCOPES; ELECTRONS; ICE; MEDICAL IMAGING; THICKNESS GAGES;

CRYO-ELECTRON MICROSCOPY; EFTEM; ENERGY FILTERING; ENERGY-FILTERING TEM; FILTERED IMAGES; ICE LAYERS; IMAGE INTENSITIES; INELASTIC MEAN FREE PATH; MEAN FREE PATH OF ELECTRONS; SLOW SCAN CCD CAMERA;

THICKNESS MEASUREMENT;

ICE;

ARTICLE; CALIBRATION; CAMERA; CRYOELECTRON MICROSCOPY; ELECTRON; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032923224     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00436.x     Document Type: Article

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