Comparison of diffraction methods for measurement of surface damage in superalloys

Journal of Materials Research

Volumn 21, Issue 7, 2006, Pages 1775-1781

  Brewer, L N ^a,d   Othon, M A ^a   Gao, Y ^a   Hazel, B T ^b   Buttrill, W H ^b   Zhong, Zhong ^c  

^a GE GLOBAL RESEARCH   (United States)

^b GE AVIATION   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON SCATTERING; MACHINING; PLASTIC DEFORMATION; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

ELECTRON BACK SCATTERED DIFFRACTION; SURFACE DAMAGE; SYNCHROTRON HIGH ENERGY X-RAY DIFFRACTION;

SUPERALLOYS;

EID: 33747619438     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2006.0199     Document Type: Article

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