SCOPUS 정보 검색 플랫폼

Journal of Electroceramics

Volumn 27, Issue 1, 2011, Pages 7-12

IR-wavelength optical shutter based on ITO/VO2/ITO thin film stack

(4) Heinilehto, Santtu T a Lappalainen, Jyrki H a Jantunen, Heli M a Lantto, Vilho a

a UNIVERSITY OF OULU (Finland)

Author keywords

Metal insulator transition; PLD; Vanadium dioxide

Indexed keywords

1550 NM; INTERNAL STRAINS; JOULE HEATING EFFECT; OPTICAL CHARACTERISTICS; POST ANNEALING; SWITCH OPERATION; THIN FILM STACKS; THIN-FILM STRUCTURE; THREE-LAYER; THREE-LAYER STRUCTURES; TWO LAYERS; VANADIUM DIOXIDE;

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DEPOSITION; METAL INSULATOR BOUNDARIES; PROGRAMMABLE LOGIC CONTROLLERS; PULSED LASER DEPOSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; THIN FILMS; VANADIUM; VAPOR DEPOSITION;

METAL INSULATOR TRANSITION;

EID: 80051700064 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-010-9604-9 Document Type: Article

Times cited : (24)

References (16)

1
- 4244014869
- 10.1103/PhysRevLett.3.34 1:CAS:528:DyaF3cXitVOrsg%3D%3D
- FJ Morin 1959 Phys. Rev. Lett. 3 34 10.1103/PhysRevLett.3.34 1:CAS:528:DyaF3cXitVOrsg%3D%3D
- (1959) Phys. Rev. Lett. , vol.3 , pp. 34
- Morin, F.J.¹

2
- 0000253351
- 10.1103/PhysRevB.16.3338 1:CAS:528:DyaE1cXjtVyhsw%3D%3D
- M Gupta AJ Freeman DE Ellis 1977 Phys. Rev. B 16 3338 10.1103/PhysRevB.16.3338 1:CAS:528:DyaE1cXjtVyhsw%3D%3D
- (1977) Phys. Rev. B , vol.16 , pp. 3338
- Gupta, M.¹ Freeman, A.J.² Ellis, D.E.³

3
- 38849172466
- 2 thin films
- DOI 10.1016/j.sna.2007.05.002, PII S0924424707003780
- J Lappalainen S Heinilehto S Saukko V Lantto H Jantunen 2008 Sensor Actuat. A-Phys. 142 250 255 10.1016/j.sna.2007.05.002 (Pubitemid 351199590)
- (2008) Sensors and Actuators, A: Physical , vol.142 , Issue.1 , pp. 250-255
- Lappalainen, J.¹ Heinilehto, S.² Saukko, S.³ Lantto, V.⁴ Jantunen, H.⁵

4
- 0028403916
- 10.1143/JJAP.33.1478 1:CAS:528:DyaK2cXkt1ahsrg%3D
- P Jin S Tanemura 1994 Jpn. J. Appl. Phys. 33 1478 10.1143/JJAP.33.1478 1:CAS:528:DyaK2cXkt1ahsrg%3D
- (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 1478
- Jin, P.¹ Tanemura, S.²

5
- 0043173805
- 2 structures
- DOI 10.1134/1.1589573
- AA Velichko NA Kuldin GB Stefanovich AL Pergament 2003 Tech. Phys. Lett. 29 507 10.1134/1.1589573 1:CAS:528:DC%2BD3sXkvVartr8%3D (Pubitemid 36931910)
- (2003) Technical Physics Letters , vol.29 , Issue.6 , pp. 507-509
- Velichko, A.A.¹ Kuldin, N.A.² Stefanovich, G.B.³ Pergament, A.L.⁴

6
- 22844448701
- Fabrication of vanadium oxide micro-optical switches
- DOI 10.1016/j.sna.2005.03.063, PII S0924424705001482
- H Wang X Yi S Chen X Fu 2005 Sensor Actuat. A-Phys. 122 108 10.1016/j.sna.2005.03.063 (Pubitemid 41037293)
- (2005) Sensors and Actuators, A: Physical , vol.122 , Issue.1 SPEC. ISS. , pp. 108-112
- Wang, H.¹ Yi, X.² Chen, S.³ Fu, X.⁴

7
- 33748880986
- Introduction to terahertz pulses
- DOI 10.1007/10828028-1, Terahertz Optoelectronics
- D Xiao KW Kim JM Zavada 2005 J. Appl. Phys. 97 1 10.1007/10828028-1 (Pubitemid 44418322)
- (2005) Topics in Applied Physics , vol.97 , pp. 1-30
- Sakai, K.¹ Tani, M.²

8
- 80051676800
- C-A Nguyen H-J Shin KT Kim Y-H Han S Moon 2005 Sensor Actuat. A-Phys. 123 78
- (2005) Sensor Actuat. A-Phys. , vol.123 , pp. 78
- Nguyen, C.-A.¹ Shin, H.-J.² Kim, K.T.³ Han, Y.-H.⁴ Moon, S.⁵

9
- 0030232151
- 10.1016/S0040-6090(96)08536-7 1:CAS:528:DyaK2sXlvVA%3D
- M-H Lee M-G Kim 1996 Thin Solid Films 286 219 10.1016/S0040-6090(96) 08536-7 1:CAS:528:DyaK2sXlvVA%3D
- (1996) Thin Solid Films , vol.286 , pp. 219
- Lee, M.-H.¹ Kim, M.-G.²

10
- 0032122850
- 10.1016/S0169-4332(98)00201-3
- C Jinzhong D Daoan J Wanshun 1998 Appl. Surf. Sci. 133 225 10.1016/S0169-4332(98)00201-3
- (1998) Appl. Surf. Sci. , vol.133 , pp. 225
- Jinzhong, C.¹ Daoan, D.² Wanshun, J.³

11
- 0032131531
- 10.1143/JJAP.37.4433 1:CAS:528:DyaK1cXmtVSktLc%3D
- M Nagashima H Wada K Tanikawa H Shirahata 1998 Jpn. J. Appl. Phys. 37 4433 10.1143/JJAP.37.4433 1:CAS:528:DyaK1cXmtVSktLc%3D
- (1998) Jpn. J. Appl. Phys. , vol.37 , pp. 4433
- Nagashima, M.¹ Wada, H.² Tanikawa, K.³ Shirahata, H.⁴

12
- 79957947586
- Electrochromic semiconductor nanocrystal films
- DOI 10.1063/1.1430852
- Y Muraoka Z Hiroi 2002 Appl. Phys. Lett. 80 4 10.1063/1.1430852 (Pubitemid 34069693)
- (2002) Applied Physics Letters , vol.80 , Issue.1 , pp. 4
- Wang, C.¹ Shim, M.² Guyot-Sionnest, P.³

13
- 0342298517
- 2 thin films
- DOI 10.1016/S0025-5408(99)00232-9
- F Béteille L Mazerolles J Livage 1999 Mater. Res. Bull. 3 2177 10.1016/S0025-5408(99)00232-9 (Pubitemid 30589777)
- (1999) Materials Research Bulletin , vol.34 , Issue.14 , pp. 2177-2184
- Beteille, F.¹ Mazerolles, L.² Livage, J.³

14
- 0000754701
- 10.1016/S0042-207X(00)00328-6 1:CAS:528:DC%2BD3cXotFaksrw%3D
- FO Adurodija H Izumi T Ishihara H Yoshioka H Matsui M Motoyama 2000 Vacuum 59 641 10.1016/S0042-207X(00)00328-6 1:CAS:528:DC%2BD3cXotFaksrw%3D
- (2000) Vacuum , vol.59 , pp. 641
- Adurodija, F.O.¹ Izumi, H.² Ishihara, T.³ Yoshioka, H.⁴ Matsui, H.⁵ Motoyama, M.⁶

15
- 0035507155
- Elastic properties of indium tin oxide films
- DOI 10.1016/S0040-6090(01)01373-6, PII S0040609001013736
- T Wittkowski J Jorzick H Seitz B Schröder K Jung B Hillebrands 2001 Thin Solid Films 398-399 465 10.1016/S0040-6090(01)01373-6 (Pubitemid 33107125)
- (1993) Thin Solid Films , vol.398-399 , pp. 465-470
- Wittkowski, T.¹ Jorzick, J.² Seitz, H.³ Schroder, B.⁴ Jung, K.⁵ Hillebrands, B.⁶

16
- 13444309353
- 3 ceramic target
- DOI 10.1016/j.tsf.2004.08.032, PII S0040609004011423
- SH Kim N-M Park TY Kim GY Sung 2005 Thin Solid Films 475 262 10.1016/j.tsf.2004.08.032 1:CAS:528:DC%2BD2MXhtVKgurg%3D (Pubitemid 40206323)
- (2005) Thin Solid Films , vol.475 , Issue.1-2 SPEC. ISS. , pp. 262-266
- Kim, S.H.¹ Park, N.-M.² Kim, T.³ Sung, G.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.