Structure characterization of vanadium oxide thin films prepared by magnetron sputtering methods

Applied Surface Science

Volumn 133, Issue 3, 1998, Pages 225-229

  Cui, Jingzhong ^a   Da, Daoan ^a   Jiang, Wanshun ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Atomic force microscopy; Polycrystalline; Vanadium oxides

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; FILM PREPARATION; MAGNETRON SPUTTERING; OXIDES; POLYCRYSTALLINE MATERIALS; SURFACE STRUCTURE; THIN FILMS; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

VANADIUM OXIDE;

VANADIUM COMPOUNDS;

EID: 0032122850     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00201-3     Document Type: Article

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