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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 8, 1998, Pages 4433-4438

The electronic behaviors of oxygen-deficient VO2 thin films in low temperature region

(4) Nagashima, Mitsuhiro a Wada, Hideo a Tanikawa, Kunihiro a Shirahata, Hiromichi a

a JAPAN DEFENSE AGENCY (Japan)

Author keywords

Electronic transport; Laser ablation; Thin films; Vanadium dioxide

Indexed keywords

ELECTRIC RESISTANCE; LASER ABLATION; THIN FILMS; VANADIUM COMPOUNDS; VANADIUM DEPOSITS;

OXYGEN DEFICIENCY;

ELECTRIC PROPERTIES;

EID: 0032131531 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.4433 Document Type: Article

Times cited : (12)

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