Analysis of the interface and its position in C60n+ secondary ion mass spectrometry depth profiling

Analytical Chemistry

Volumn 81, Issue 1, 2009, Pages 75-79

  Green, F M ^a   Shard, A G ^a   Gilmore, I S ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH RESOLUTIONS; INTERFACE POSITIONS; INTERFACIAL WIDTHS; IRGANOX 1010; MOLECULAR INFORMATIONS; OPTIMUM METHODS; ORGANIC MATERIALS; ORGANIC/INORGANIC INTERFACES; PRIMARY IONS; SECONDARY IONS; SIMS DEPTH PROFILES; SIMS DEPTH PROFILING; SUBSTRATE INTERFACES; VARIATIONS OF; WAFER SUBSTRATES; WORK FOCUSES;

HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; IONS; MASS SPECTROMETRY; SECONDARY ION MASS SPECTROMETRY;

DEPTH PROFILING;

EID: 58149467679     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac801352r     Document Type: Article

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