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Volumn 105, Issue 39, 2001, Pages 9474-9486

Collision cascade and sputtering process in a polymer

Author keywords

[No Author keywords available]

Indexed keywords

FRAGMENTATION;

EID: 0035807644     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp011099e     Document Type: Article
Times cited : (47)

References (39)
  • 2
    • 0002623954 scopus 로고    scopus 로고
    • Fundamental aspects of organic SIMS
    • Vickerman, J.C., Briggs, D., Eds.; SurfaceSpectra/IM Publications: Manchester, in press
    • Delcorte, A. Fundamental Aspects of Organic SIMS in ToF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman, J.C., Briggs, D., Eds.; SurfaceSpectra/IM Publications: Manchester, in press.
    • ToF-SIMS: Surface Analysis by Mass Spectrometry
    • Delcorte, A.1
  • 15
    • 0011379152 scopus 로고    scopus 로고
    • Complementary information concerning these simulations can be found at the following Internet address: http://www.ee.surrey.ac.uk/SCRIBA/simulations/.
  • 36
    • 0003700966 scopus 로고
    • Mazzoldi, P., Arnold, G.W., Eds.; Elsevier: Amsterdam
    • Biersack, J.P. in Ion Beam Modification of Materials; Mazzoldi, P., Arnold, G.W., Eds.; Elsevier: Amsterdam, 1987; p 648.
    • (1987) Ion Beam Modification of Materials , pp. 648
    • Biersack, J.P.1
  • 37
    • 0011336539 scopus 로고    scopus 로고
    • Information concerning this program can be found at the following Internet address: http://www.research.ibm.com/ion-beams/SRIM/.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.