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Volumn 84, Issue 4, 2011, Pages

Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

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Indexed keywords


EID: 79961187147     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.045307     Document Type: Article
Times cited : (24)

References (33)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.