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Volumn 151, Issue 18, 2011, Pages 1252-1255

Electrical and microscopic characterization of ZnO films on p-SiC substrates

Author keywords

A. Heterojunctions; A. Nanostructures; A. Semiconductors; C. Grain boundaries

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC RECTIFIERS; GRAIN BOUNDARIES; HETEROJUNCTIONS; II-VI SEMICONDUCTORS; LEAKAGE CURRENTS; METALLIC FILMS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DIODES; SILICON CARBIDE; THERMAL EVAPORATION; WIDE BAND GAP SEMICONDUCTORS; ZINC OXIDE;

EID: 79961172287     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2011.05.043     Document Type: Article
Times cited : (12)

References (20)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.