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Volumn 82, Issue 7, 2011, Pages

Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER EXCITATION; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; FREQUENCY-DEPENDENT; HIGH FREQUENCY; HIGH-SPEED; HIGH-SPEED OPERATION; LOOP CIRCUIT; PHASE CORRECTIONS; PHASE DELAY; Q-FACTORS; REAL TIME; SIGNAL DELAYS; WIDE-BAND;

EID: 79961149906     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3608447     Document Type: Article
Times cited : (5)

References (18)
  • 3
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    • edited by S. Morita, R. Wiesendanger, and F. J. Giessibl (Springer-Verlag, Berlin) Vol.
    • Noncontact Atomic Force Microscopy (Nanoscience and Technology) edited by, S. Morita, R. Wiesendanger, and, F. J. Giessibl, (Springer-Verlag, Berlin, 2009) Vol. 2.
    • (2009) Noncontact Atomic Force Microscopy (Nanoscience and Technology) , vol.2
  • 5
    • 24144473649 scopus 로고    scopus 로고
    • True atomic resolution in liquid by frequency-modulation atomic force microscopy
    • DOI 10.1063/1.1999856, 034101
    • T. Fukuma, K. Kobayashi, K. Matsushige, and H. Yamada, Appl. Phys. Lett. 87, 034101 (2005). 10.1063/1.1999856 (Pubitemid 41227642)
    • (2005) Applied Physics Letters , vol.87 , Issue.3 , pp. 1-3
    • Fukuma, T.1    Kobayashi, K.2    Matsushige, K.3    Yamada, H.4
  • 12
    • 79956096742 scopus 로고    scopus 로고
    • 10.1088/1468-6996/11/3/033003
    • T. Fukuma, Sci. Technol. Adv. Mater. 11, 033003 (2010). 10.1088/1468-6996/11/3/033003
    • (2010) Sci. Technol. Adv. Mater. , vol.11 , pp. 033003
    • Fukuma, T.1
  • 15
    • 15844390647 scopus 로고    scopus 로고
    • Quantitative force measurements using frequency modulation atomic force microscopy - Theoretical foundations
    • DOI 10.1088/0957-4484/16/3/018
    • J. E. Sader, T. Uchihashi, M. J. Higgins, A. Farrell, Y. Nakayama, and S. P. Jarvis, Nanotechnology 16, S94 (2005). 10.1088/0957-4484/16/3/018 (Pubitemid 40421825)
    • (2005) Nanotechnology , vol.16 , Issue.3
    • Sader, J.E.1    Uchihashi, T.2    Higgins, M.J.3    Farrell, A.4    Nakayama, Y.5    Jarvis, S.P.6
  • 17
    • 61449201929 scopus 로고    scopus 로고
    • 10.1063/1.3086418
    • T. Fukuma, Rev. Sci. Instrum. 80, 023707 (2009). 10.1063/1.3086418
    • (2009) Rev. Sci. Instrum. , vol.80 , pp. 023707
    • Fukuma, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.