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Volumn 83, Issue 15, 2011, Pages

Dynamics and microscopic origin of fast 1.5 μm emission in Er-doped SiO2 sensitized with Si nanocrystals

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[No Author keywords available]

Indexed keywords


EID: 79961119920     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.155323     Document Type: Article
Times cited : (12)

References (28)
  • 12
    • 33751095390 scopus 로고    scopus 로고
    • Nanosecond dynamics of the near-infrared photoluminescence of Er-doped SiO2 sensitized with Si nanocrystals
    • DOI 10.1103/PhysRevLett.97.207401
    • I. Izeddin, A. S. Moskalenko, I. N. Yassievich, M. Fujii, and T. Gregorkiewicz, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.207401 97, 207401 (2006). (Pubitemid 44771846)
    • (2006) Physical Review Letters , vol.97 , Issue.20 , pp. 207401
    • Izeddin, I.1    Moskalenko, A.S.2    Yassievich, I.N.3    Fujii, M.4    Gregorkiewicz, T.5
  • 20
    • 33847135655 scopus 로고    scopus 로고
    • Photoluminescence of Si layers grown on oxidized Si surfaces
    • DOI 10.1063/1.2435063
    • A. A. Shklyaev, Y. Nakamura, and M. Ichikawa, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2435063 101, 033532 (2007). (Pubitemid 46280866)
    • (2007) Journal of Applied Physics , vol.101 , Issue.3 , pp. 033532
    • Shklyaev, A.A.1    Nakamura, Y.2    Ichikawa, M.3
  • 27
    • 0000181469 scopus 로고    scopus 로고
    • Direct spectral probing of energy storage in Si:Er by a free-electron laser
    • DOI 10.1063/1.125556, PII S0003695199003526
    • T. Gregorkiewicz, D. T. X. Thao, and J. M. Langer, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.125556 75, 4121 (1999). (Pubitemid 129709776)
    • (1999) Applied Physics Letters , vol.75 , Issue.26 , pp. 4121-4123
    • Gregorkiewicz, T.1    Thao, D.T.X.2    Langer, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.