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Applied Physics Letters

Volumn 94, Issue 24, 2009, Pages

Observation of temperature-independent internal Er3+ relaxation efficiency in Si-rich SiO2 films

(4) Savchyn, Oleksandr a Todi, Ravi M a Coffey, Kevin R a Kik, Pieter G a

a UNIVERSITY OF CENTRAL FLORIDA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ER-DOPED; EXCITATION EVENTS; LOW TEMPERATURES; PHOTOLUMINESCENCE MEASUREMENTS; PUMP EFFICIENCY; RELAXATION RATES; SAMPLE TEMPERATURE; SI-RICH SIO2; STABLE OPERATION; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; THERMAL CONDITION; TIME-DEPENDENT;

ERBIUM;

EID: 67649199350 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3157135 Document Type: Article

Times cited : (15)

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