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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 12, 2011, Pages

High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

(11) Martin, N M a Knudsen, J a Blomberg, S a Gustafson, J a Andersen, J N a Lundgren, E a Ingelsten, H Härelind b Carlsson, P A b Skoglundh, M b Stierle, A c,d Kresse, G e

a LUND UNIVERSITY (Sweden)

b CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

c UNIVERSITY OF SIEGEN (Germany)

d MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

e UNIVERSITY OF VIENNA (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961041702 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.125417 Document Type: Article

Times cited : (23)

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