A simple series resistance extraction methodology for advanced CMOS devices

IEEE Electron Device Letters

Volumn 32, Issue 8, 2011, Pages 1047-1049

  Campbell, J P ^a   Cheung, K P ^a   Suehle, J S ^a   Oates, A ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY   (Taiwan)

Author keywords

Series resistance

Indexed keywords

ADVANCED CMOS DEVICE; DEVICE UNDER TEST; EXTERNAL RESISTANCE; EXTERNAL RESISTORS; SERIES RESISTANCES;

EID: 79960898583     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2158183     Document Type: Article

References (15)

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