Coulomb force directed single and binary assembly of nanoparticles from aqueous dispersions by AFM nanoxerography

ACS Nano

Volumn 5, Issue 5, 2011, Pages 4228-4235

  Palleau, Etienne ^a   Sangeetha, Neralagatta M ^a   Viau, Guillaume ^a   Marty, Jean Daniel ^b   Ressier, Laurence ^a  

^a INSA   (France)

^b UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

AFM; Colloidal nanoparticles; Directed assembly; KFM; Nanoxerography

Indexed keywords

AFM; COLLOIDAL NANOPARTICLES; DIRECTED ASSEMBLY; KFM; NANOXEROGRAPHY;

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; GOLD COMPOUNDS; NANOPARTICLES; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SILICON WAFERS;

DISPERSIONS;

NANOMATERIAL; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COLLOID; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; MICROMANIPULATION; PARTICLE SIZE; RADIATION EXPOSURE; STATIC ELECTRICITY; SURFACE PROPERTY; ULTRASTRUCTURE;

COLLOIDS; CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; STATIC ELECTRICITY; SURFACE PROPERTIES; WATER;

EID: 79960808356     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn2011893     Document Type: Article

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