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Volumn 131, Issue 12, 2011, Pages 2769-2774
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Enhanced ultravioletvisible cathodoluminescence from Ar beam-induced nano-patterned silicon
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Author keywords
Amorphous nanostructures; Cathodoluminescence; Ion bombardment; Ripple pattern
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Indexed keywords
AFTER HIGH TEMPERATURE;
AMORPHOUS NANOSTRUCTURES;
BLUE SHIFT;
FRONT SURFACES;
HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPES;
IMAGING DATA;
LUMINESCENCE BAND;
NANO-STRUCTURED;
NEAR INFRARED;
RED PEAK;
RIPPLE PATTERNS;
ROOM TEMPERATURE;
SITE-SPECIFIC;
ULTRA-VIOLET;
CATHODOLUMINESCENCE;
ION BOMBARDMENT;
IONS;
RECRYSTALLIZATION (METALLURGY);
SCANNING ELECTRON MICROSCOPY;
SILICON;
AMORPHOUS SILICON;
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EID: 79960561157
PISSN: 00222313
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jlumin.2011.07.008 Document Type: Article |
Times cited : (4)
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References (25)
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