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Volumn 74, Issue 8, 1999, Pages 1114-1116

Depth profiling of GaN by cathodoluminescence microanalysis

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EID: 22244435964 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.123460 Document Type: Article

Times cited : (75)

References (15)

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