Nanomechanical characterization by double-pass force-distance mapping

Nanotechnology

Volumn 22, Issue 29, 2011, Pages

  Dagdas, Yavuz S ^a   Necip Aslan, M ^b   Tekinay, Ayse B ^a   Guler, Mustafa O ^a   Dâna, Aykutlu ^a  

^a BILKENT UNIVERSITY   (Turkey)

^b ISTANBUL TECHNICAL UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

DITHER SIGNALS; DOUBLE PASS; FORCE-DISTANCE CURVES; INTERACTION FORCES; NANOMECHANICAL CHARACTERIZATION; SELF-ASSEMBLED; TAPPING MODES; HIGH SPEED;

NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

MAPPING;

EID: 79960537793     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/29/295704     Document Type: Article

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