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Volumn 99, Issue 1, 2011, Pages

Two-dimensional electron gas properties by current-voltage analyses of Al0.86In0.14N/AlN/GaN heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

ALN; CURRENT VOLTAGE; CURRENT VOLTAGE CURVE; CURRENT-VOLTAGE MEASUREMENTS; HALL MEASUREMENTS; HIGH ELECTRON MOBILITY; INTERLAYER THICKNESS; ROOM TEMPERATURE; SCHOTTKY CONTACTS; TWO-DIMENSIONAL ELECTRON GAS (2DEG);

EID: 79960498818     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3608162     Document Type: Article
Times cited : (20)

References (15)
  • 1
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    • S. J. Pearton and F. Ren, Adv. Mater. 12, 1571 (2000). 10.1002/1521-4095(200011)12:211.0.CO;2-#
    • (2000) Adv. Mater. , vol.12 , pp. 1571
    • Pearton, S.J.1    Ren, F.2
  • 6
    • 34247846340 scopus 로고    scopus 로고
    • High-mobility window for two-dimensional electron gases at ultrathin AlNGaN heterojunctions
    • DOI 10.1063/1.2736207
    • Y. Cao and D. Jena, Appl. Phys. Lett. 90, 182112 (2007). 10.1063/1.2736207 (Pubitemid 46701175)
    • (2007) Applied Physics Letters , vol.90 , Issue.18 , pp. 182112
    • Cao, Y.1    Jena, D.2
  • 14
    • 34848922373 scopus 로고    scopus 로고
    • High electron mobility in nearly lattice-matched AlInNAlNGaN heterostructure field effect transistors
    • DOI 10.1063/1.2794419
    • J. Xie, X. Ni, M. Wu, J. H. Leach,. zgr, and H. Morko, Appl. Phys. Lett. 91, 132116 (2007). 10.1063/1.2794419 (Pubitemid 47502576)
    • (2007) Applied Physics Letters , vol.91 , Issue.13 , pp. 132116
    • Xie, J.1    Ni, X.2    Wu, M.3    Leach, J.H.4    Ozgur, U.5    Morko, H.6
  • 15
    • 33644853778 scopus 로고    scopus 로고
    • 0.62N/AlN/GaN HEMT structures
    • DOI 10.1016/j.jcrysgro.2005.11.118, PII S002202480501434X
    • C. Wang, X. Wang, G. Hu, J. Wang, H. Xiao, and J. Li, J. Cryst. Growth 289, 414 (2006). 10.1016/j.jcrysgro.2005.11.118 (Pubitemid 43374767)
    • (2006) Journal of Crystal Growth , vol.289 , Issue.2 , pp. 415-418
    • Wang, C.1    Wang, X.2    Hu, G.3    Wang, J.4    Xiao, H.5    Li, J.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.