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Volumn 84, Issue 1, 2011, Pages
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Structural and optical properties of Sb65Se 35-xGex thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION COEFFICIENTS;
AMORPHOUS STRUCTURES;
COMPOSITIONAL DEPENDENCE;
ELECTRON BEAM EVAPORATION;
MATRIX;
NETWORK MODELS;
OPTICAL TRANSMISSION MEASUREMENTS;
STRUCTURAL AND OPTICAL PROPERTIES;
ULTRASONICALLY CLEANED GLASS SUBSTRATES;
ANTIMONY;
ELECTRON BEAMS;
GERMANIUM;
LIGHT TRANSMISSION;
OPTICAL PROPERTIES;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SELENIUM COMPOUNDS;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
OPTICAL FILMS;
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EID: 79960491357
PISSN: 00318949
EISSN: 14024896
Source Type: Journal
DOI: 10.1088/0031-8949/84/01/015604 Document Type: Article |
Times cited : (14)
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References (45)
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