Structural and optical properties of SeGe and SeGeX (X = In, Sb and Bi) amorphous films

Journal of Alloys and Compounds

Volumn 485, Issue 1-2, 2009, Pages 604-609

  Fadel, M ^a   Fayek, S A ^b   Abou Helal, M O ^c   Ibrahim, M M ^b   Shakra, A M ^a  

^a Ain Shams University   (Egypt)

^b NATIONAL CENTER FOR RADIATION RESEARCH AND TECHNOLOGY   (Egypt)

^c NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

Chalcogenide glasses; Optical properties; Structure

Indexed keywords

AS-DEPOSITED FILMS; BI THIN FILMS; CHALCOGENIDE GLASS; CHALCOGENIDE GLASSES; CHEMICAL COMPOSITIONS; COMPLEX DIELECTRIC CONSTANT; DISSIPATION FACTORS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; GLASS SUBSTRATES; INDIRECT TRANSITION; OPTICAL ABSORPTION; OPTICAL DISPERSION; OPTICAL PARAMETER; SINGLE-OSCILLATOR MODEL; SPECTRAL DISTRIBUTION; SPECTROPHOTOMETRIC MEASUREMENTS; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL CHARACTERIZATION; WAVELENGTH RANGES;

DISPERSION (WAVES); GERMANIUM; GLASS; OPTICAL CONSTANTS; REFRACTIVE INDEX; SEMICONDUCTING SELENIUM COMPOUNDS; STRUCTURAL PROPERTIES; THIN FILMS; X RAY SPECTROSCOPY;

AMORPHOUS FILMS;

EID: 72149124238     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.06.057     Document Type: Article

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