Spectral features of Co-Ge-Te amorphous thin film

Optics and Laser Technology

Volumn 43, Issue 1, 2011, Pages 20-24

  Mahdy, Iman A ^a,b   Domashevskaya, E P ^a   Seredin, P V ^a   Yatsenko, O B ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

^b Assiut Branch   (Egypt)

Author keywords

Amorphous semiconductors; Chalcogenide GeTe doped with cobalt; Optical spectra

Indexed keywords

ABSORPTION BAND; AMORPHOUS THIN FILMS; BAND EDGE; BAND TAIL; COBALT CONCENTRATION; COBALT CONTENT; DIELECTRIC CONSTANTS; EXTINCTION COEFFICIENTS; IMAGINARY PARTS; NORMAL INCIDENCE; OPTICAL SPECTRA; ROOM TEMPERATURE; SPECTRAL FEATURE; SPECTRAL RANGE;

ABSORPTION SPECTROSCOPY; AMORPHOUS SEMICONDUCTORS; COBALT; GERMANIUM; LIGHT REFRACTION; ORGANIC POLYMERS; REFRACTIVE INDEX; REFRACTOMETERS; THIN FILMS; VAPOR DEPOSITION;

AMORPHOUS FILMS;

EID: 77955510307     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2010.04.019     Document Type: Article

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