Optical and spectroscopic characterization of germanium selenide glass films

Journal of Non-Crystalline Solids

Volumn 355, Issue 37-42, 2009, Pages 1984-1988

  Santos, Luís F ^a   Ganjoo, Ashtosh ^b   Jain, Himanshu ^b   Almeida, Rui M ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b Lehigh University   (United States)

Author keywords

Chalcogenides; Ellipsometry; FTIR measurements; Planar waveguides; Raman scattering; Raman spectroscopy

Indexed keywords

ANTIMONY COMPOUNDS; ATOMIC FORCE MICROSCOPY; CHALCOGENIDES; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GERMANIUM COMPOUNDS; GLASS; OPTICAL GLASS; PHASE SEPARATION; PLANAR WAVEGUIDES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SILICA; SILICON WAFERS; SINGLE CRYSTALS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THERMAL EVAPORATION; VACUUM EVAPORATION;

FTIR MEASUREMENTS; GERMANIUM SELENIDE GLASS; HETEROGENEOUS SURFACE; IR AND RAMAN SPECTRA; SILICA GLASS SUBSTRATE; SINGLE CRYSTAL SILICON; SPECTROSCOPIC CHARACTERIZATION; VACUUM THERMAL EVAPORATION;

OPTICAL FILMS;

EID: 69149109139     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.04.057     Document Type: Article

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