Sulfur 1s near-edge x-ray absorption fine structure (NEXAFS) of thiol and thioether compounds

Journal of Chemical Physics

Volumn 134, Issue 24, 2011, Pages

  Beyhan, Shirin ^a   Hu, Yongfeng ^b   Urquhart, Stephen G ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b CANADIAN LIGHT SOURCE INC   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATA; FINE FEATURE; GASPHASE; HARTREE-FOCK AB INITIO CALCULATIONS; HIGH RESOLUTION; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTRUM; SATURATION EFFECTS; SPECTROSCOPIC FEATURES; SULFUR K-EDGE; THIOETHERS; VIRTUAL ORBITALS;

ABSORPTION; CALCULATIONS; GASES; QUANTUM CHEMISTRY; SULFUR; SULFUR COMPOUNDS; X RAY ABSORPTION; X RAYS;

ABSORPTION SPECTROSCOPY;

SULFIDE; SULFUR; THIOL DERIVATIVE;

ARTICLE; CHEMISTRY; METHODOLOGY; X RAY ABSORPTION SPECTROSCOPY;

SULFHYDRYL COMPOUNDS; SULFIDES; SULFUR; X-RAY ABSORPTION SPECTROSCOPY;

EID: 79960200227     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3602218     Document Type: Article

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