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Volumn 17, Issue 5, 2010, Pages 683-688
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K-edge XANES analysis of sulfur compounds: An investigation of the relative intensities using internal calibration
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Author keywords
internal calibration; quantitative analysis; self absorption; sulfur; XANES
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Indexed keywords
COMPLEX MATRICES;
CONCENTRATION RANGES;
DILUTE SOLUTION;
FLUORESCENCE RADIATIONS;
FLUORESCENCE SIGNALS;
INTENSITY PATTERNS;
INTERNAL CALIBRATION;
MODEL COMPOUND;
NON-LINEAR CORRELATIONS;
QUANTITATIVE ANALYSIS;
REFERENCE DATA;
REFERENCE SPECTRUM;
RELATIVE INTENSITY;
SELF-ABSORPTION;
SPECIATION OF SULFUR;
SULFUR CONTENTS;
SULFUR K-EDGE;
X-RAY ABSORPTION NEAR-EDGE STRUCTURE;
XANES;
XANES ANALYSIS;
XANES SPECTRA;
ABSORPTION;
CALIBRATION;
FLUORESCENCE;
SULFUR;
SULFUR COMPOUNDS;
SULFUR DETERMINATION;
ABSORPTION SPECTROSCOPY;
CHONDROITIN SULFATE;
DIMETHYL SULFOXIDE;
SULFUR DERIVATIVE;
ARTICLE;
CALIBRATION;
CHEMISTRY;
METHODOLOGY;
X RAY ABSORPTION SPECTROSCOPY;
CALIBRATION;
CHONDROITIN SULFATES;
DIMETHYL SULFOXIDE;
SULFUR COMPOUNDS;
X-RAY ABSORPTION SPECTROSCOPY;
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EID: 77955973014
PISSN: 09090495
EISSN: 16005775
Source Type: Journal
DOI: 10.1107/S0909049510022946 Document Type: Article |
Times cited : (63)
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References (10)
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