Sulfur edge XANES and XPS spectroscopy of ethanethiol adsorbed on nickel

Surface Science

Volumn 566-568, Issue 1-3 PART 1, 2004, Pages 597-602

  Syed, J A ^a,c   Sardar, S A ^a,d   Yagi, S ^b   Tanaka, K ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c DHAKA UNIVERSITY OF ENGINEERING AND TECHNOLOGY   (Bangladesh)

^d University of California   (United States)

Author keywords

Electrical transport (conductivity, resistivity, mobility, etc.); Nickel; Sulphur; X ray absorption spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

ALUMINA; CHARGE TRANSFER; CHEMICAL BONDS; CHEMISORPTION; ELECTROCHEMICAL SENSORS; NANOSTRUCTURED MATERIALS; SULFUR; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ELECTRICAL TRANSPORT; ORGANI-INORGANIC INTERFACES; X-RAY ABSORPTION NEAR-EDGE SPECTROSCOPY (XANES);

NICKEL;

EID: 4544355488     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.131     Document Type: Conference Paper

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