The local adsorption geometry of benzenethiolate on Cu(1 0 0)

Surface Science

Volumn 602, Issue 14, 2008, Pages 2453-2462

  Allegretti, F ^a   Bussolotti, F ^b   Woodruff, D P ^a   Dhanak, V R ^c,d   Beccari, M ^e   Di Castro, V ^e   Betti, M G ^b   Mariani, C ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

^d DARESBURY LABORATORY   (United Kingdom)

^e SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

Benzenethiol; Chemisorption; Copper; NEXAFS; Photoelectron diffraction; Surface structure; X ray standing waves

Indexed keywords

ABSORPTION; ADSORPTION; ATOMIC PHYSICS; ATOMS; COPPER ALLOYS; SURFACE RELAXATION; SURFACE STRUCTURE;

ADSORPTION GEOMETRIES; ATOMIC LAYERS; CU(1 1 0); ENERGY MODES; HOLLOW SITES; MOLECULAR PLANES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); NORMAL INCIDENCE X-RAY STANDING WAVES (NIXSW); PHOTOELECTRON DIFFRACTION; SURFACE LAYERING; SURFACE NORMALS;

COPPER;

EID: 48349084360     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.05.032     Document Type: Article

References (54)

1. Schreiber F. Prog. Surf. Sci. 65 (2000) 151
2. Whitesides G.M., Mathias J.P., and Seto C.T. Science 254 (1991) 1312
3. Dubois L.H., and Nuzzo R.G. Annu. Rev. Phys. Chem. 43 (1992) 437
4. Ulmann A. Chem. Rev. 96 (1996) 1533
5. Woodruff D.P. Appl. Surf. Sci. 254 (2007) 76
6. Yu M., Bovet N., Satterley C.J., Bengió S., Lovelock K.R.J., Milligan P.K., Jones R.G., Woodruff D.P., and Dhanak V.R. Phys. Rev. Lett. 97 (2006) 166102
7. Maksymovych P., Sorescu D.C., and Yates Jr. J.T. Phys. Rev. Lett. 97 (2006) 146103
8. Mazzarello R., Cossaro A., Verdini A., Rousseau R., Casalis L., Danisman M.F., Floreano L., Scandolo S., Morgante A., and Scoles G. Phys. Rev. Lett. 98 (2007) 016102
9. Agron P.A., and Carlson T.A. J. Vac. Sci. Technol. 20 (1982) 815
10. Wong K., Kwon K., Rao B.V., Liu A., and Bartels L. J. Am. Chem. Soc. 126 (2004) 7762
11. Agron P.A., Carlson T.A., Dress W.B., and Nyberg G.L. J. Electron. Spectrosc. Relat. Phenom. 42 (1987) 313
12. Shen W., Nyberg G.L., and Liesegang J. Surf. Sci. 298 (1993) 143
13. Anderson S.E., and Nyberg G.L. J. Electron. Spectrosc. Relat. Phenom. 52 (1990) 735
14. Di Castro V., Bussolotti F., and Mariani C. Surf. Sci. 598 (2005) 218
15. Whelan C.M., Barnes C.J., Walker C.G.H., and Brown N.M.D. Surf. Sci. 425 (1999) 195
16. Jaffey D.M., and Madix R.J. J. Am. Chem. Soc. 116 (1994) 3020
17. Kane S.M., Rufael T.S., Gland J.L., Huntley D.R., and Fischer D.A. J. Phys. Chem. B 101 (1997) 8486
18. Takata Y., Yokoyama T., Yagi S., Happo N., Sato H., Seki K., Ohta T., Kitajima Y., and Kuroda H. Surf. Sci. 259 (1991) 266
19. Stöhr J., and Outka D.A. Phys. Rev. B 36 (1987) 7891
20. Roberts J.T., and Friend C.M. J. Chem. Phys. 88 (1988) 7172
21. Bol C.W.J., Friend C.M., and Xu X. Langmuir 12 (1996) 6083
22. Stöhr J. NEXAFS Spectroscopy (1992), Springer-Verlag, Berlin
23. Woodruff D.P. Prog. Surf. Sci. 57 (1998) 1
24. Woodruff D.P. Rep. Prog. Phys. 68 (2005) 743
25. Woodruff D.P., and Bradshaw A.M. Rep. Prog. Phys. 57 (1994) 1029
26. Woodruff D.P. Surf. Sci. Rep. 62 (2007) 1
27. Robinson A.W., D'Addato S., Dhanak V.R., Finetti P., and Thornton G. Rev. Sci. Instrum. 66 (1995) 1762
28. C.J. Powell, A. Jablonski, NIST electron effective-attenuation-length database, NIST Standard Reference Database 82, NIST, Gaithersburg, USA, 2003.
29. Allegretti F., Woodruff D.P., Dhanak V.R., Mariani C., Bussolotti F., and D'Addato S. Surf. Sci. 598 (2005) 253
30. V. Di Castro, private communication.
31. Dezarnaud C., Tronc M., and Hitchcock A.P. Chem. Phys. 142 (1990) 455
32. Kondoh H., Saito N., Matsui F., Yokoyama T., Ohta T., and Kuroda H. J. Phys. Chem. B 105 (2001) 12870
33. Rieley H., Kendall G.K., Chan A., Jones R.G., Lüdecke J., Woodruff D.P., and Cowie B.C.C. Surf. Sci. 392 (1997) 143
34. Sardar S.A., Syed J.A., Yagi S., and Tanaka K. Thin Solid Films 450 (2004) 265
35. XSWfit is a procedure, written as an Igor-Pro macro, which automatically fits XSW data. It is based on the formalism originally developed by D.P. Woodruff in Fortran for calculating the XSW profile for a given set of parameters. A copy of the Igor routines can be obtained from R.G. Jones, email: robert.g.jones@nottingham.ac.uk.
36. Zegenhagen J. Surf. Sci. Rep. 18 (1993) 199
37. Lee J.J., Fisher C.J., Woodruff D.P., Roper M.G., Jones R.G., and Cowie B.C.C. Surf. Sci. 494 (2001) 166
38. Woodruff D.P., Cowie B.C.C., and Ettema A.R.H.F. J. Phys.: Condens. Matter 6 (1994) 10633
39. Fritzsche V. J. Phys.: Condens. Matter 2 (1990) 1413
40. Fritzsche V. Surf. Sci. 265 (1992) 187
41. Fritzsche V. Surf. Sci. 213 (1989) 648
42. Pendry J.B. J. Phys. C: Solid State Phys. 13 (1980) 937
43. Booth N.A., Davis R., Toomes R., Woodruff D.P., Hirschmugl C., Schindler K.-M., Schaff O., Fernandez V., Theobald A., Hofmann Ph., Lindsay R., Giessel T., Baumgärtel P., and Bradshaw A.M. Surf. Sci. 387 (1997) 152
44. Rozsondai B., Schultz G., and Hargittai I. J. Mol. Struct. 70 (1981) 309
45. Schultz G., Hargittai I., Kolonits M., and Garbarczyk J. J. Mol. Struct. 160 (1987) 267
46. Gie(el T., Schaff O., Lindsay R., Terborg R., Baumgärtel P., Hoeft J.T., Polcik M., Bradshaw A.M., Koebbel A., Lloyd D.R., and Woodruff D.P. J. Chem. Phys. 110 (1999) 9666
47. Terborg R., Polcik M., Hoeft J.T., Kittel M., Pascal M., Kang J.H., Lamont C.L.A., Bradshaw A.M., and Woodruff D.P. Surf. Sci. 457 (2000) 1
48. Allegretti F., Polcik M., and Woodruff D.P. Surf. Sci. 601 (2007) 3611
49. M. Beccari, A. Kanjilal, S. Morpurgo, M.G. Betti, C. Mariani, L. Floreano, A. Cossaro, V. Di Castro, unpublished work.
50. Kariapper M.S., Fisher C.J., Woodruff D.P., Cowie B.C.C., and Jones R.G. J. Phys.: Condens. Matter 12 (2000) 2153
51. Imanishi A., Takenaka S., Yokoyama T., Kitajima Y., and Ohta T. J. Phys. IV France 7 (1997) C2-701
52. Driver S.M., and Woodruff D.P. Surf. Sci. 488 (2001) 207
53. Jackson G.J., Woodruff D.P., Jones R.G., Singh N.K., Chan A.S.Y., Cowie B.C.C., and Formoso V. Phys. Rev. Lett. 84 (2000) 119
54. Driver S.M., and Woodruff D.P. Surf. Sci. 457 (2000) 11