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Volumn 23, Issue 10, 2011, Pages 2518-2520

SrHfO3 films grown on Si(100) by plasma-assisted atomic layer deposition

Author keywords

ALD; Plasma assisted; Thin film and high ? dielectric

Indexed keywords

AIR-ANNEALING; ALD; ELECTRICAL CHARACTERIZATION; METAL OXIDE SEMICONDUCTOR; METAL PRECURSOR; OXFORD INSTRUMENTS; OXYGEN PLASMAS; PLASMA-ASSISTED; POWER SOURCES; RELATIVE PERMITTIVITY; SI (100) SUBSTRATE; SI(1 0 0); SUBSTRATE TEMPERATURE;

EID: 79959934127     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm200315u     Document Type: Article
Times cited : (26)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.