Structural transformations in (Au,In)/Si(111) system and their effect on surface conductivity

Surface Science

Volumn 605, Issue 15-16, 2011, Pages 1420-1425

  Gruznev, D V ^a   Matetskiy, A V ^a   Bondarenko, L V ^a   Borisenko, E A ^a   Tsukanov, D A ^a   Zotov, A V ^a,b,c   Saranin, A A ^a,b  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b FAR EASTERN FEDERAL UNIVERSITY   (Russian Federation)

^c VLADIVOSTOK STATE UNIVERSITY OF ECONOMICS AND SERVICE   (Russian Federation)

Author keywords

Atom solid interactions; Conductivity measurements; Gold; Indium; Low energy electron diffraction (LEED); Scanning tunneling microscopy (STM); Silicon; Surface structure

Indexed keywords

ALLOYING; BINARY ALLOYS; CRYSTAL ATOMIC STRUCTURE; DOMAIN WALLS; ELECTRON DIFFRACTION; ELECTRONS; FILM GROWTH; GOLD; GOLD ALLOYS; INDIUM; LOW ENERGY ELECTRON DIFFRACTION; REPAIR; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON ALLOYS; SUBSTRATES; SURFACE STRUCTURE;

ATOM-SOLID INTERACTION; CONDUCTIVITY MEASUREMENTS; ELECTRICAL CHARACTERIZATION; FOUR-POINT PROBE TECHNIQUES; ISLAND FORMATION; SI(111) SUBSTRATE; STRUCTURAL TRANSFORMATION; SURFACE CONDUCTIVITY;

SURFACE RECONSTRUCTION;

EID: 79959842013     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.05.004     Document Type: Article

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