Atomic depth distribution and effects of surfactants in growth of Ag and Au on Si(111)-√3x√3-Ga(1ML), -4x1-In and -2√3x2√3-Sn surfaces at room temperature

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 8, 2002, Pages 853161-853167

  Yamanaka, T ^a   Ino, S ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; GOLD; INDIUM; METAL; SILICON; SILVER; SURFACTANT; TIN;

ADSORPTION; ARTICLE; CHEMICAL ANALYSIS; ELECTRON BEAM; ELECTRON DIFFRACTION; ROOM TEMPERATURE; SURFACE PROPERTY; X RAY ANALYSIS;

EID: 0037104259     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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