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Volumn 98, Issue 23, 2011, Pages

XPS study of Sb-/In-doping and surface pinning effects on the Fermi level in SnO2 (101) thin films

(10) Nagata, T a,b Bierwagen, O a White, M E a Tsai, M Y a Yamashita, Y b Yoshikawa, H b Ohashi, N b Kobayashi, K b Chikyow, T b Speck, J S a

a University of California (United States)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; CONDUCTION-BAND MINIMUM; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; PROBE SURFACE; SB-DOPED; SURFACE BAND BENDING; SURFACE ELECTRON ACCUMULATION; SURFACE FERMI-LEVEL PINNING; SURFACE PINNING EFFECTS;

CONDUCTION BANDS; ELECTRON MOBILITY; FERMI LEVEL; PHOTOELECTRON SPECTROSCOPY; TIN; TIN DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTOR DOPING;

EID: 79959347167 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3596449 Document Type: Article

Times cited : (42)

References (20)

1
- 0642355930
- 0022-3697, 10.1016/0022-3697(62)90236-6
- E. E. Kohnke, J. Phys. Chem. Solids 0022-3697 23, 1557 (1962). 10.1016/0022-3697(62)90236-6
- (1962) J. Phys. Chem. Solids , vol.23 , pp. 1557
- Kohnke, E.E.¹

2
- 0009901916
- 0021-4922, 10.1143/JJAP.4.195
- M. Nagasawa, S. Shionoya, and S. Makishim, Jpn. J. Appl. Phys., Part 1 0021-4922 4, 195 (1965). 10.1143/JJAP.4.195
- (1965) Jpn. J. Appl. Phys., Part 1 , vol.4 , pp. 195
- Nagasawa, M.¹ Shionoya, S.² Makishim, S.³

3
- 1842535348
- 0003-6951, 10.1063/1.1651326
- J. Choudhary, S. B. Ogale, S. R. Shinde, V. N. Kulkarni, T. Vendatesan, K. S. Harshavardhan, M. Strikovski, and B. Hannoyer, Appl. Phys. Lett. 0003-6951 84, 1483 (2004). 10.1063/1.1651326
- (2004) Appl. Phys. Lett. , vol.84 , pp. 1483
- Choudhary, J.¹ Ogale, S.B.² Shinde, S.R.³ Kulkarni, V.N.⁴ Vendatesan, T.⁵ Harshavardhan, K.S.⁶ Strikovski, M.⁷ Hannoyer, B.⁸

4
- 0842311705
- 0003-6951, 10.1063/1.1639515
- H. Kim and A. Pique, Appl. Phys. Lett. 0003-6951 84, 218 (2004). 10.1063/1.1639515
- (2004) Appl. Phys. Lett. , vol.84 , pp. 218
- Kim, H.¹ Pique, A.²

5
- 29644436938
- Gas-phase-dependent properties of SnO2 (110), (100), and (101) single-crystal surfaces: Structure, composition, and electronic properties
- DOI 10.1103/PhysRevB.72.165414, 165414
- M. Batzill, K. Katsiev, J. M. Burst, and U. Diebold, Phys. Rev. B 0556-2805 72, 165414 (2005). 10.1103/PhysRevB.72.165414 (Pubitemid 43022053)
- (2005) Physical Review B - Condensed Matter and Materials Physics , vol.72 , Issue.16 , pp. 1-20
- Batzill, M.¹ Katsiev, K.² Burst, J.M.³ Diebold, U.⁴ Chaka, A.M.⁵ Delley, B.⁶

6
- 33744718126
- Electrical and gas-sensitive properties of a resistive thin-film sensor based on tin dioxide
- DOI 10.1134/S1063782606060170
- O. V. Anisimov, V. I. Gaman, N. K. Maksimova, S. M. Mazalov, and E. V. Chernikov, Semiconductors 1063-7826 40, 704 (2006). 10.1134/S1063782606060170 (Pubitemid 43823956)
- (2006) Semiconductors , vol.40 , Issue.6 , pp. 704-709
- Anisimov, O.V.¹ Gaman, V.I.² Maksimova, N.K.³ Mazalov, S.M.⁴ Chernikov, E.V.⁵

7
- 0032606580
- 0003-6951, 10.1063/1.124122
- H. Kim, A. Pique, J. S. Horwitz, H. Mattoussi, H. Murata, Z. H. Kafafi, and D. B. Chrisey, Appl. Phys. Lett. 0003-6951 74, 3444 (1999). 10.1063/1.124122
- (1999) Appl. Phys. Lett. , vol.74 , pp. 3444
- Kim, H.¹ Pique, A.² Horwitz, J.S.³ Mattoussi, H.⁴ Murata, H.⁵ Kafafi, Z.H.⁶ Chrisey, D.B.⁷

8
- 13444251212
- Highly transparent AgSn O2 ohmic contact to p -type GaN for ultraviolet light-emitting diodes
- DOI 10.1063/1.1834990
- J. O. Song and T. Y. Seong, Appl. Phys. Lett. 0003-6951 85, 6374 (2004). 10.1063/1.1834990 (Pubitemid 40211469)
- (2004) Applied Physics Letters , vol.85 , Issue.26 , pp. 6374-6376
- Song, J.-O.¹ Seong, T.-Y.²

9
- 7044264973
- 0022-3727, 10.1088/0022-3727/37/20/006
- R. E. Presley, C. L. Munsee, C. -H. Park, D. Hong, J. F. Wager, and D. A. Keszler, J. Phys. D 0022-3727 37, 2810 (2004). 10.1088/0022-3727/37/20/006
- (2004) J. Phys. D , vol.37 , pp. 2810
- Presley, R.E.¹ Munsee, C.L.² Park, C.-H.³ Hong, D.⁴ Wager, J.F.⁵ Keszler, D.A.⁶

10
- 20344361957
- 2:Sb films
- DOI 10.1016/j.jcrysgro.2004.11.387, PII S0022024804018937
- E. Elangovan, S. A. Shivashankar, and K. Ramamurthi, J. Cryst. Growth 0022-0248 276, 215 (2005). 10.1016/j.jcrysgro.2004.11.387 (Pubitemid 40785214)
- (2005) Journal of Crystal Growth , vol.276 , Issue.1-2 , pp. 215-221
- Elangovan, E.¹ Shivashankar, S.A.² Ramamurthi, K.³

11
- 39049130104
- 3 (0001) by MOCVD
- DOI 10.1016/j.matlet.2007.10.002, PII S0167577X07010063
- X. J. Feng, J. Ma, F. Yang, F. Ji, F. J. Zong, C. N. Luan, and H. L. Ma, Mater. Lett. 0167-577X 62, 1779 (2008). 10.1016/j.matlet.2007.10.002 (Pubitemid 351249021)
- (2008) Materials Letters , vol.62 , Issue.12-13 , pp. 1779-1781
- Feng, X.¹ Ma, J.² Yang, F.³ Ji, F.⁴ Zong, F.⁵ Luan, C.⁶ Ma, H.⁷

12
- 70450274966
- 0021-8979, 10.1063/1.3254241
- M. E. White, O. Bierwagen, M. Y. Tsai, and J. S. Speck, J. Appl. Phys. 0021-8979 106, 093704 (2009). 10.1063/1.3254241
- (2009) J. Appl. Phys. , vol.106 , pp. 093704
- White, M.E.¹ Bierwagen, O.² Tsai, M.Y.³ Speck, J.S.⁴

13
- 49149091965
- 0031-9007, 10.1103/PhysRevLett.101.055502
- A. K. Singh, A. Janotti, M. Scheffler, and C. G. Van de Walle, Phys. Rev. Lett. 0031-9007 101, 055502 (2008). 10.1103/PhysRevLett.101.055502
- (2008) Phys. Rev. Lett. , vol.101 , pp. 055502
- Singh, A.K.¹ Janotti, A.² Scheffler, M.³ Van De Walle, C.G.⁴

14
- 77952774537
- 1882-0778, 10.1143/APEX.3.051101
- M. E. White, O. Bierwagen, M. Y. Tsai, and J. S. Speck, Appl. Phys. Express 1882-0778 3, 051101 (2010). 10.1143/APEX.3.051101
- (2010) Appl. Phys. Express , vol.3 , pp. 051101
- White, M.E.¹ Bierwagen, O.² Tsai, M.Y.³ Speck, J.S.⁴

15
- 0028387002
- 0142-2421, 10.1002/sia.740210302
- S. Tanuma, C. J. Powell, and D. R. Penn, Surf. Interface Anal. 0142-2421 21, 165 (1994). 10.1002/sia.740210302
- (1994) Surf. Interface Anal. , vol.21 , pp. 165
- Tanuma, S.¹ Powell, C.J.² Penn, D.R.³

16
- 79955685006
- 0003-6951, 10.1063/1.3583446
- O. Bierwagen, J. S. Speck, T. Nagata, T. Chikyow, Y. Yamashita, H. Yoshikawa, and K. Kobayashi, Appl. Phys. Lett. 0003-6951 98, 172101 (2011). 10.1063/1.3583446
- (2011) Appl. Phys. Lett. , vol.98 , pp. 172101
- Bierwagen, O.¹ Speck, J.S.² Nagata, T.³ Chikyow, T.⁴ Yamashita, Y.⁵ Yoshikawa, H.⁶ Kobayashi, K.⁷

17
- 50849097034
- 0734-2101, 10.1116/1.2966423
- M. E. White, M. Y. Tsai, F. Wu, and J. S. Speck, J. Vac. Sci. Technol. A 0734-2101 26, 1300 (2008). 10.1116/1.2966423
- (2008) J. Vac. Sci. Technol. A , vol.26 , pp. 1300
- White, M.E.¹ Tsai, M.Y.² Wu, F.³ Speck, J.S.⁴

18
- 57849124586
- 0003-6951, 10.1063/1.3052930
- O. Bierwagen, T. Ive, C. G. Van de Walle, and J. S. Speck, Appl. Phys. Lett. 0003-6951 93, 242108 (2008). 10.1063/1.3052930
- (2008) Appl. Phys. Lett. , vol.93 , pp. 242108
- Bierwagen, O.¹ Ive, T.² Van De Walle, C.G.³ Speck, J.S.⁴

19
- 70350145700
- 1882-0778, 10.1143/APEX.2.106502
- O. Bierwagen, M. E. White, M. Y. Tsai, T. Nagata, and J. S. Speck, Appl. Phys. Express 1882-0778 2, 106502 (2009). 10.1143/APEX.2.106502
- (2009) Appl. Phys. Express , vol.2 , pp. 106502
- Bierwagen, O.¹ White, M.E.² Tsai, M.Y.³ Nagata, T.⁴ Speck, J.S.⁵

20
- 76949089454
- 0021-8979, 10.1063/1.3298467
- T. Nagata, O. Bierwagen, M. E. White, M. Y. Tsai, and J. S. Speck, J. Appl. Phys. 0021-8979 107, 033707 (2010). 10.1063/1.3298467
- (2010) J. Appl. Phys. , vol.107 , pp. 033707
- Nagata, T.¹ Bierwagen, O.² White, M.E.³ Tsai, M.Y.⁴ Speck, J.S.⁵

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