Neutron induced single event multiple transients with voltage scaling and body biasing

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Harada, Ryo ^a,b   Mitsuyama, Yukio ^a,b   Hashimoto, Masanori ^a,b   Onoye, Takao ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BODY BIASING; BODY VOLTAGE; CMOS PROCESSS; MEASURED RESULTS; MEASUREMENT CIRCUIT; MEASUREMENT RESULTS; REVERSE BODY BIASING; SINGLE EVENT; SINGLE EVENT TRANSIENTS; SPATIAL SPREADING; TEST CHIPS; VOLTAGE-SCALING;

CMOS INTEGRATED CIRCUITS; TRANSIENTS;

POWER QUALITY;

EID: 79959309387     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784485     Document Type: Conference Paper

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