Multiple event transient induced by nuclear reactions in CMOS logic cells

Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium

Volumn , Issue , 2007, Pages 137-145

  Rusu, C ^a   Bougeral, A ^b   Anghel, L ^a   Weulerse, C ^b   Buard, N ^b   Benhammadi, S ^a   Renaud, N ^c   Hubert, G ^b   Wrobel, F ^d   Carriere, T ^b   Gaillard, R ^c  

^a TIMA LABORATORY   (France)

^b AIRBUS GROUP INNOVATIONS   (Germany)

^c ATMEL ^*

^d UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

[No Author keywords available]

Indexed keywords

(N-1) CRITERION; ATMOSPHERIC NEUTRONS; CMOS LOGIC CELLS; INTERNATIONAL (CO); NAND GATES; NANOMETER TECHNOLOGIES; NEUTRON ENERGY RANGE; NUCLEAR REACTIONS; OCCURRENCE PROBABILITY; ON LINE TESTING; SINGLE EVENT TRANSIENT (SET);

ADDITION REACTIONS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; CELLS; LOGIC CIRCUITS; LOGIC DEVICES; NEUTRONS; NUCLEAR ENERGY; NUCLEAR PHYSICS; NUCLEAR REACTORS; PHOTOACOUSTIC EFFECT; REACTION KINETICS; TRANSIENTS;

SPICE;

EID: 46749136822     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2007.46     Document Type: Conference Paper

References (16)

1. A. Taber and E. Normand, "Single Event Upsets in Avionics", IEEE Trans. Nucl. Sci., vol. 40, No. 2, pp. 120-126, April 1993.
2. C. A. Gossett and al., "Single Event Phenomema in Atmospheric Neutron Environments", IEEE Trans. Nucl. Sci., vol. 40, No. 6, pp. 1845-1852, December 1993.
3. "Terrestrial Cosmic Rays and Soft Errors", IBM Journal of Research and Development, pp. 19-39, January 1996.
4. E. Normand, "Single Event Upset at Ground Level", IEEE Trans. Nucl. Sci., Vol. 43, 1996.
5. E. Normand, "Extensions of the burst generation rate method for wider application to proton/neutron induced single event effects", IEEE Trans. Nucl. Sci., 45, 1998.
6. P. Calvel and al., "An empirical model for predicting proton induced upset", IEEE Trans. Nucl. Sci., Vol. 43, No. 6, 1996.
7. L. D. Edmonds, "Proton SEU cross sections derived from heavy ion test data", IEEE Trans. Nucl. Sci., Vol. 47, No. 5, 2000.
8. C. Vial and al., "A new approach for the prediction of the neutron-induced SEU rate", IEEE Trans. Nucl. Sci., Vol. 45, pp. 2915-2920, Dec. 1998.
9. G. Hubert and al., "Detailed Analysis of Secondary Ions' Effect for the calculation of neutron-induced SER in SRAMs", IEEE Trans. Nucl. Sci., Vol. 48, No. 6, 2001.
10. th IEEE International On-Line Testing Symposium 2005, Saint-Raphael, France.
11. th IEEE International On-Line Testing Symposium 2006, Como, Italy, pp. 63-74.
12. G. C. Messenger, "Collection of charge on junction nodes from ion tracks", IEEE Trans. Nucl. Sci., 1982, pp. 2024-2031
13. S. V. Walstra and C. Dai, "Circuit-Level Modeling of Soft Errors in Integrated Circuits", IEEE Trans.On Device And Materials Reliability, Vol. 5, No. 3, 2005
14. G. R. Srinivason, P. C. Murley, and H. K. Tang, "Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation," IEEE Int. Reliability Physics Symp., San Jose, CA, 1994, pp. 1216.
15. K. Castellani-Coulié J.-M. Palau, G. Hubert, M.-C. Calvet, P. E. Dodd and F. Sexton, "Various SEU Conditions in SRAM Studied by 3-D Device Simulation" IEEE Trans. Nucl. Sci., Vol. 48, No. 6, 2001
16. M. B. Chadwick and al., "Use of New ENDF/B-VI Proton and Neutron Cross Sections for Single Event Upset Calculations", IEEE Trans. Nucl. Sci., vol. 46, No. 6, pp. 1386, 1999.