Product reliability and thin-film photovoltaics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7412, Issue , 2009, Pages

  Gaston, Ryan ^a   Feist, Rebekah ^a   Yeung, Simon ^a   Hus, Mike ^a   Bernius, Mark ^a   Langlois, Marc ^a   Bury, Scott ^a   Granata, Jennifer ^b   Quintana, Michael ^b   Carlson, Carl ^c   Sarakakis, Georgios ^c   Ogden, Douglas ^c   Mettas, Adamantios ^c  

^a DOW CHEMICAL COMPANY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c RELIASOFT CORPORATION   (United States)

Author keywords

BIPV; Design for reliability; Partnership; Product development; Reliability; Thin film

Indexed keywords

ACCELERATED TESTING; BIPV; COST ADVANTAGES; COST OF ENERGIES; DESIGN FOR RELIABILITY; ELECTRICAL GENERATION; ENERGY GENERATIONS; HYDROCARBON PRICES; INDUSTRIAL COLLABORATION; MARKET PENETRATION; NEW TECHNOLOGIES; PARADIGM SHIFTS; PARTNERSHIP; PHOTOVOLTAICS; PRODUCT DEVELOPMENT PROCESS; PRODUCT LIFETIME; PRODUCT RELIABILITY; RELIABILITY TESTING; SAFETY TESTS; THIN FILM PHOTOVOLTAICS;

COSTS; ENVIRONMENTAL IMPACT; FAILURE ANALYSIS; HYDROCARBONS; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; PHOTOVOLTAIC EFFECTS; PRODUCT DEVELOPMENT; SAFETY TESTING; TECHNOLOGY;

ELECTRIC GENERATORS;

EID: 77956824408     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.825415     Document Type: Conference Paper

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