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Volumn 4, Issue 6, 2011, Pages

Determination of composition and lattice relaxation in semipolar ternary (IN,AL,GA)n strained layers from symmetric x-ray diffraction measurements

(3) Young, Erin C a Romanov, Alexey E a,b,c Speck, James S a

a University of California (United States)

b IOFFE INSTITUTE (Russian Federation)

c UNIVERSITY OF TARTU (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

BASAL PLANES; BRAGG'S LAW; DEGREE OF RELAXATION; III-NITRIDE; LATTICE RELAXATION; LATTICE TILTS; MISFIT DISLOCATION DENSITIES; RECIPROCAL SPACE MAPS; ROCKING CURVES; SEMIPOLAR; SLIP SYSTEM; STRAIN STATE; STRAINED LAYERS; WURZITE; X RAY MEASUREMENTS; X-RAY DIFFRACTION MEASUREMENTS;

HETEROJUNCTIONS; NITRIDES; X RAY DIFFRACTION;

LATTICE MISMATCH;

EID: 79958776853 PISSN: 18820778 EISSN: 18820786 Source Type: Journal
DOI: 10.1143/APEX.4.061001 Document Type: Article

Times cited : (32)

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