A study of the parameters influencing the microstructure of thick La 2Zr2O7 films

Journal of Crystal Growth

Volumn 325, Issue 1, 2011, Pages 68-75

  Cloet, V ^a   Lommens, P ^a   Huhne R ^b   De Buysser, K ^a   Hoste, S ^a   Van Driessche, I ^a  

^a GHENT UNIVERSITY   (Belgium)

^b IFW DRESDEN   (Germany)

Author keywords

A1. Crystal morphology; A3. Chemical solution deposition; B1. Pyrochlores; B2. Superconducting materials

Indexed keywords

A3. CHEMICAL SOLUTION DEPOSITION; B2. SUPERCONDUCTING MATERIALS; CRYSTAL MORPHOLOGIES; NANO-VOIDS; OVERALL QUALITY; POLE FIGURE; PYROCHLORES; SEED LAYER; SOL-GEL ROUTES; TEM OBSERVATIONS; THICK LAYERS; WATER BASED; XRD;

SUPERCONDUCTING MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM;

LANTHANUM;

EID: 79958742510     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2011.04.029     Document Type: Article

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