MOD buffer/YBCO approach to fabricate low-cost second generation HTS wires

IEEE Transactions on Applied Superconductivity

Volumn 17, Issue 2, 2007, Pages 3332-3335

  Paranthaman, M P ^a   Sathyamurthy, S ^a   Bhuiyan, M S ^a   Martin, P M ^a   Aytug, T ^a   Kim, K ^a   Fayek, M ^a   Leonard, K J ^a   Li, J ^a   Goyal, A ^a   Kodenkandath, T ^b   Li, X ^b   Zhang, W ^b   Rupich, M W ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

Chemical solution deposition; Electron microscopy; High temperature superconductors; Transport property measurements; X ray measurements

Indexed keywords

BUFFER LAYERS; CRITICAL CURRENTS; MEASUREMENT THEORY; TRANSPORT PROPERTIES; WIRE; X RAY ANALYSIS;

CHEMICAL SOLUTION DEPOSITION; TRANSPORT PROPERTY MEASUREMENTS; X-RAY MEASUREMENTS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 34547440830     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2007.899636     Document Type: Conference Paper

References (10)

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